Tin oxide was deposited by using vacuum thermal method on silicon wafer engraved by Computer Numerical Controlled (CNC) Machine. The inscription was engraved by diamond-made brine. Deep 0.05 mm in the form of concentric squares. Electrical results in the dark were shown high value of forward current and the high value of the detection factor from 6.42 before engraving to 10.41 after engraving. (I-V) characters in illumination with powers (50, 100, 150, 200, 250) mW/cm2 show Improved properties of the detector, Especially at power (150, 200, 250) mW/cm2. Response improved in rise time from 2.4 μs to 0.72 μs and time of inactivity improved 515.2 μs to 44.2 μs. Sensitivity angle increased at zone from 40o to 65o.

This research was designed to study effect of performance appraisal dimensions on organizational confidence.

Asset completion questionnaire was used to collect data of this research from a random simple represent forty employees who works in Iraqi Oil ministry. The main result of this research was positive relations and the effect between performance appraisal and organizational confidence. The research contains some conclusions, the main of it is unimplemented the performance appraisal results in the policies of employees in the ministry and it work in classic methods incentives and training.

The important recommendations must doing to achieve integrating between the result of pe

Bekhme formation, Dernir Dagh well -1 has been divided into two facies units using core
sample slides and depending on sedimentary structures and diagenetic processes .The facies
reflect the environment of the foreslope.This work proves the absence of Bekhme formation
in Dernir Dagh
Well- 1 as a tongue as reported by the Oil Exploration Company. Some species and genera of
bentonic foraminifera were identified. The age of Bekhme formation was estimated
depending on the recognized index fossils to be lower Maastrichtian.

Thin films of CdS:Cu were deposited onto glass substrate temperature 400 °c. The optieal properties have been studied for Cds doped with (1,3, 8) wt% of Cu before and after Gamma irradiation. It was found that the irradiation caused an ( Frenkel defects) where the atom is displaced from its original site leaving vacancy and forming on interstitial atom. It was found the irradiation caused an absorption edge shifting towards long wavelength as a result of the increasing of Cu concentration.

Background: Oral health is important to the quality of life of all individuals. Oral lesions can cause discomfort or pain that interferes with mastication, swallowing, and speech. Oral disease is a health problem that is not only a matter of oral hygiene and local condition, but can also be a precursor to other dangerous and potentially life threatening illnesses. The present study was designed to analyze the main clinicopathological aspects of most common oral lesions in patients who visit the Oral Diagnosis Clinic of the College of Dentistry, University of Sulaimani, Kurdistan region, Iraq. Patients and methods: This prospective study was performed on 3144 patients from July 2009-July 2010. In this study a total of 3144 patients were e

Background: Exposure to microwaves radiation from microwave oven may be harmful for users especially for the one who have highest contact with microwave oven. Because the body is electrochemical in nature, any force that disrupts or changes human electrochemical events will affect the physiology of the body by destabilization and interruption of many chemical body substance including growth factors.The insulin-like growth factors (IGFs) are a family of mitogenic proteins that control growth, differentiation, and the maintenance of differentiated function in numerous tissues. It fulfils an important role in growth and development of teeth, mandible, maxillae, and tongue. Platelet derived growth factors (PDGF) are proteins that regulate cell

Abstract: This paper presents the results of the structural and optical analysis of CdS thin films prepared by Spray of Pyrolysis (SP) technique. The deposited CdS films were characterized using spectrophotometer and the effect of Sulfide on the structural properties of the films was investigated through the analysis of X-ray diffraction pattern (XRD). The growth of crystal became stronger and more oriented as seen in the X-ray diffraction pattern. The studying of X-ray diffraction showed that; all the films have the hexagonal structure with lattice constants a=b=4.1358 and c=6.7156A°, the crystallite size of the CdS thin films increases and strain (ε) as well as the dislocation density (δ) decreases. Also, the optical properties of the