Alloy
Thermal evaporation technique
Thin films
XRD
AFM
Optical properties
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In this paper, the effect of sulfur substitution by arsenic on the structural, optical properties
of thin films of the trivalent chalcogenide Se66S44-xAsx at different concentrations (where x
= 0, 8, 16, and 24 at %) was studied. Thin films with a thickness of (300±10 nm) were
prepared using thermal evaporation of bulk samples. Structural examinations were
performed using XRD and AFM techniques. All the studied film samples were amorphous
in structure and the intensity of the crystalline parts was high in the range of 10-40. Also, in
Atomic Force Microscopy (AFM). It was found that increasing the concentration of arsenic
affects the structural parameters such as surface roughness, particle density, and average
grain size. As the ar
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