Article - FT-IR and XPS analysis of a-Si1-xGex:H thin films - Digital Repository

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Publication Date

Thu May 01 2003

Journal Name

Renewable Energy

Volume

28

10.1016/S0960-1481(02)00061-7

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FT-IR and XPS analysis of a-Si1-xGex:H thin films

M.N. Makadsi

M. F. A. Alias

A.A. Essa

H.R. AI-Azawi

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