Preferred Language
Articles
/
ohcqnpEBVTCNdQwCkZZz
Preparing the Electrical Signal Data of the Heart by Performing Segmentation Based on the Neural Network U-Net
...Show More Authors

Research on the automated extraction of essential data from an electrocardiography (ECG) recording has been a significant topic for a long time. The main focus of digital processing processes is to measure fiducial points that determine the beginning and end of the P, QRS, and T waves based on their waveform properties. The presence of unavoidable noise during ECG data collection and inherent physiological differences among individuals make it challenging to accurately identify these reference points, resulting in suboptimal performance. This is done through several primary stages that rely on the idea of preliminary processing of the ECG electrical signal through a set of steps (preparing raw data and converting them into files that are read and then processed by removing empty data and unifying the width of the signal at a length of 250 in order to remove noise accurately, and then performing the process of identifying the QRS in the first place and P-T implicitly, and then the task stage is determining the required peak and making a cut based on it. The U-Net pre-trained model is used for deep learning. It takes an ECG signal with a customisable sampling rate as input and generates a list of the beginning and ending points of P and T waves, as well as QRS complexes, as output. The distinguishing features of our segmentation method are its high speed, minimal parameter requirements, and strong generalization capabilities, which are used to create data that can be used in diagnosing diseases or biometric systems.

Scopus Clarivate Crossref
View Publication
Publication Date
Sun May 07 2017
Journal Name
Ibn Al-haitham Journal For Pure And Applied Sciences
Study the Effect of Annealing Temperature on the Structural, Optical and Electrical Properties of ZnS Thin Films
...Show More Authors

The structural, optical and electrical properties of ZnS films prepared by vacuum
evaporation technique on glass substrate at room temperature and treated at different
annealing temperatures (323, 373, 423)K of thickness (0.5)µm have been studied. The
structure of these films is determined by X-ray diffraction (XRD). The X-ray diffraction
studies show that the structure is polycrystalline with cubic structure, and there are strong
peaks at the direction (111).
The optical properties investigated which include the absorbance and transmittance
spectra, energy band gab, absorption coefficient, and other optical constants. The results
showed that films have direct optical transition. The optical band gab was

... Show More
View Publication Preview PDF
Publication Date
Wed Feb 20 2019
Journal Name
Iraqi Journal Of Physics
The influence of CdCl2 layer and annealing process on the structural and electrical properties of CdTe films
...Show More Authors

A polycrystalline CdTefilms have been prepared by thermal evaporation technique on glass substrate at room temperature. The films thickness was about700±50 nm. Some of these films were annealed at 573 K for different duration times (60, 120 and 180 minutes), and other CdTe films followed by a layer of CdCl2 which has been deposited on them, and then the prepared CdTe films with CdCl2 layer have been annealed for the same conditions. The structures of CdTe films without and with CdCl2 layer have been investigated by X-ray diffraction. The as prepared and annealed films without and with CdCl2 layer were polycrystalline structure with preferred orientation at (111) plane. The better structural pr

... Show More
View Publication Preview PDF
Crossref (1)
Crossref
Publication Date
Sun Feb 26 2012
Journal Name
Ibn Al-haitham Journal For Pure And Applied Science
Study the Effect of Annealing Temperature on the Structural, Optical and Electrical Properties of ZnS Thin Films
...Show More Authors

The structural, optical and electrical properties of ZnS films prepared by vacuum evaporation technique on glass substrate at room temperature and treated at different annealing temperatures (323, 373, 423)K of thickness (0.5)µm have been studied. The structure of these films is determined by X-ray diffraction (XRD). The X-ray diffraction studies show that the structure is polycrystalline with cubic structure, and there are strong peaks at the direction (111). The optical properties investigated which include the absorbance and transmittance spectra, energy band gab, absorption coefficient, and other optical constants. The results showed that films have direct optical transition. The optical band gab was found to be in the range t

... Show More
Publication Date
Tue Sep 11 2018
Journal Name
Iraqi Journal Of Physics
The effects of silica addition on the structural, electrical and mechanical characteristics of MgAl2O4 spinel ceramic phase
...Show More Authors

The ceramic compound Mg1-xSixAl2O4 (x= 0, 0.1, 0.2, 0.3, 0.4) was prepared from nano powder of Al2O3 and MgO doped with Nano powder of SiO2 at different molar ratios. The specimens were prepared by standard chemical solid reaction technique and sintered at 1450 oC. Structure of the specimens was analyzed by using X-ray diffraction (XRD). The X-ray patterns of the specimens showed the formation of pure simple cubic spinel structure MgAl2O4 phase with space group of ̅ . The average grain size and surface topology were studied by atomic force microscopy. The results showed that the average grain size was about 73-90 nm. The DC electrical properties of the specimen were measured. The apparent density was found to increase and the porosity a

... Show More
View Publication Preview PDF
Crossref
Publication Date
Thu Jan 01 2009
Journal Name
Computer And Information Science 2009
The Stochastic Network Calculus Methodology
...Show More Authors

Home Computer and Information Science 2009 Chapter The Stochastic Network Calculus Methodology Deah J. Kadhim, Saba Q. Jobbar, Wei Liu & Wenqing Cheng Chapter 568 Accesses 1 Citations Part of the Studies in Computational Intelligence book series (SCI,volume 208) Abstract The stochastic network calculus is an evolving new methodology for backlog and delay analysis of networks that can account for statistical multiplexing gain. This paper advances the stochastic network calculus by deriving a network service curve, which expresses the service given to a flow by the network as a whole in terms of a probabilistic bound. The presented network service curve permits the calculation of statistical end-to-end delay and backlog bounds for broad

... Show More
View Publication
Crossref (1)
Scopus Crossref
Publication Date
Mon Mar 08 2021
Journal Name
Baghdad Science Journal
A study the electrical properties of a Se:2.5%as thin films prepared by thermal cvaporation
...Show More Authors

thin films of se:2.5% as were deposited on a glass substates by thermal coevaporation techniqi=ue under high vacuum at different thikness

View Publication Preview PDF
Crossref
Publication Date
Fri Jul 07 2017
Journal Name
International Journal Of Science And Research (ijsr)
Automatic brain tumor segmentation from MRI Images using superpixels based split and Merge algorithm
...Show More Authors

RA Ali, LK Abood, Int J Sci Res, 2017 - Cited by 2

View Publication
Publication Date
Tue Jun 30 2009
Journal Name
Al-kindy College Medical Journal
The Use of Myocardial Performance Index (Mpi) in Assessment of Heart Function
...Show More Authors

Background: Ejection fraction have been used frequently
for assessment of the left ventricular function, but can be
associated with errors in which myocardial performance
index have been used as another parameter to measure the
left ventricular function.
Objective: selecting another echocardiography parameter
for the assessment of myocardial in function instead of the
ejection fraction.
Methods: 160 patients referred to the echocardiogram unit
from the period december 2007 to august 2008 requesting
assessment of left ventricular function. After clinical
examination, routine blood tests; chest x-ray and
electrocardiographic recording have been completed. All
patients informed to come for this unit af

... Show More
View Publication Preview PDF
Publication Date
Tue Nov 01 2016
Journal Name
Journal Of Economics And Administrative Sciences
Use Dynamic Bayesian network to estimate the reliability of Adamia Water Network
...Show More Authors

Abstract\

In this research, estimated the reliability of water system network in Baghdad was done. to assess its performance during a specific period. a fault tree through static and dynamic gates was belt and these gates represent logical relationships between the main events in the network and analyzed using dynamic Bayesian networks . As it has been applied Dynamic Bayesian networks estimate reliability by translating dynamic fault tree to Dynamic Bayesian networks and reliability of the system appreciated. As was the potential for the expense of each phase of the network for each gate . Because there are two parts to the Dynamic Bayesian networks and two part of gate (AND), which includes the three basic units of the

... Show More
View Publication Preview PDF
Crossref
Publication Date
Thu Jun 01 2023
Journal Name
Journal Of Engineering
Fault Location of Doukan-Erbil 132kv Double Transmission Lines Using Artificial Neural Network ANN
...Show More Authors

Transmission lines are generally subjected to faults, so it is advantageous to determine these faults as quickly as possible. This study uses an Artificial Neural Network technique to locate a fault as soon as it happens on the Doukan-Erbil of 132kv double Transmission lines network. CYME 7.1-Programming/Simulink utilized simulation to model the suggested network. A multilayer perceptron feed-forward artificial neural network with a back propagation learning algorithm is used for the intelligence locator's training, testing, assessment, and validation. Voltages and currents were applied as inputs during the neural network's training. The pre-fault and post-fault values determined the scaled values. The neural network's p

... Show More
View Publication Preview PDF
Crossref (1)
Crossref