Background: Febrile convulsions are the most frequent type of seizures in children under 6 years of age. Significant percentage of these children will later suffer from recurrence of febrile convulsion.Objectives: To identify the main risk factors for recurrent febrile convulsions in children.Methods: we carried out a case control study involving 89 children those who experienced first attack of febrile convulsions and 92 children with recurrent attack of febrile convulsions. The study was conducted in Central Children Teaching Hospital, Baghdad during the period 2006- 2007. Results: Compared to children with first attack of febrile convulsion, children with recurrent seizures were younger at onset (4- 12m) (67% vs. 44%), mainly male (70% vs. 51%) and had more often family history (first degree relative) history of epilepsy, low degree of temperature (45% vs. 23%) and frequent febrile illnesses (83% vs. 50%). second degree family history of febrile convulsion and onset of febrile convulsion in relation to onset of fever and type of convulsion (simple vs. complex) were not significant risk factors.Conclusions: Awareness of these risk factors should lead pediatricians to suggest administration of short course of diazepam at onset of each febrile illness to prevent recurrent febrile convulsions. Also, public education on recurrent febrile convulsions is needed.
Thermal evaporation method has used for depositing CdTe films
on corning glass slides under vacuum of about 10-5mbar. The
thicknesses of the prepared films are400 and 1000 nm. The prepared
films annealed at 573 K. The structural of CdTe powder and prepared
films investigated. The hopping and thermal energies of as deposited
and annealed CdTe films studied as a function of thickness. A
polycrystalline structure observed for CdTe powder and prepared
films. All prepared films are p-type semiconductor. The hopping
energy decreased as thickness increased, while thermal energy
increased.
Regression testing being expensive, requires optimization notion. Typically, the optimization of test cases results in selecting a reduced set or subset of test cases or prioritizing the test cases to detect potential faults at an earlier phase. Many former studies revealed the heuristic-dependent mechanism to attain optimality while reducing or prioritizing test cases. Nevertheless, those studies were deprived of systematic procedures to manage tied test cases issue. Moreover, evolutionary algorithms such as the genetic process often help in depleting test cases, together with a concurrent decrease in computational runtime. However, when examining the fault detection capacity along with other parameters, is required, the method falls sh
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... Show MoreStructural and optical properties were studied as a function of Nano membrane after prepared, for tests. Nano membrane was deposited by the spray coating method on substrates (glass) of thickness 100 mm. The X-ray diffraction spectra of (CNTs, WO3) were studied. AFM tests are good information about the roughness, It had been designed electrolysis cell and fuel cell. Studies have been performed on electrochemical parameters.
Abstract
For sparse system identification,recent suggested algorithms are
-norm Least Mean Square (
-LMS), Zero-Attracting LMS (ZA-LMS), Reweighted Zero-Attracting LMS (RZA-LMS), and p-norm LMS (p-LMS) algorithms, that have modified the cost function of the conventional LMS algorithm by adding a constraint of coefficients sparsity. And so, the proposed algorithms are named
-ZA-LMS,