This paper discusses the limitation of both Sequence Covering Array (SCA) and Covering Array (CA) for testing reactive system when the order of parameter-values is sensitive. In doing so, this paper proposes a new model to take the sequence values into consideration. Accordingly, by superimposing the CA onto SCA yields another type of combinatorial test suite termed Multi-Valued Sequence Covering Array (MVSCA) in a more generalized form. This superimposing is a challenging process due to NP-Hardness for both SCA and CA. Motivated by such a challenge, this paper presents the MVSCA with a working illustrative example to show the similarities and differences among combinatorial testing methods. Consequently, the MVSCA is a

Multi-point forming (MPF) is an advanced flexible manufacture technology, and the technology results from the idea that the whole die is separated into small punches that can be adjusted height. This idea is applied to the traditional rigid blank-holder, so flexible blank-holder (FBH) idea can be obtained. In this work, the performance of a multi-point die is investigated with pins in square matrix and suitable blank holder. Each pin in the punch holder can be a significant moved according to the die high and at different load that applied with spring with respect to spring stiffness. The results shows the reduction in setting time with respect to traditional single point incremental forming process that lead to (90%). and also show duri