Loss tangent
Clausius-Mossotti equation
MnO2 nanorod
Scanning electron microscopy (SEM)
X-ray diffraction (XRD)
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this work, a simple method was used to prepare the MnO2 nanoparticles. These nanoparticles then were characterized by several
techniques, such as X-ray diffraction, Fourier transform infrared spectroscopy, scanning electron microscopy (SEM) and atomic force
microscope (AFM). The results showed that the diffraction peak of MnO2 nanoparticles was similar to that of standard data. The images of
AFM and SEM indicated that the MnO2 nanorods were growing from the MnO2 nano spherical shape. PVA-pentaerythritol/MnO2
nanocomposite films were fabricated by evaporating casting method. The dielectric constant and loss tangent of P-Ery/MnO2 films were
measured between 10 kHz and 1 MHz using LCR. As the content of MnO2 increased, the dielectric constant
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