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Abstract
Ternary Silver Indium selenide Sulfur AgInSe1.8S0.2 in pure form and with a 0.2 ratio of Sulfur
were fabricated via thermal evaporation under vacuum 3*10-6 torr on glasses substrates with a thickness
of (550) nm. These films were investigated to understand their structural, optical, and Hall Characteristics.
X-ray diffraction analysis was employed to examine the impact of varying Sulfur ratios on the structural
properties. The results revealed that the AgInSe1.8S0.2 thin films in their pure form and with a 0.2 Sulfur
ratio, both at room temperature and after annealing at 500 K, exhibited a polycrystalline nature with a
tetragonal structure and a predominant orientation along the (112) plane, indicating an enhanced de
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