Some of structural ,and electrical properties of pure and zinc (Zn) doped cadmium telluride thin films with impurity percentages (0.5, 1, 1.5)%, deposited on hot glass substrate (temperature equals to 423K) of thickness of 300nm and rate deposition of 0.5 nm.s-1 by thermal co-evaporation technique under vacuum of (2×10-5)Torr have been investigates. The structural properties for the prepared films were studied before and after. doping process by analysis of the X-ray diffraction, and it appeared that pure and dopant CdTe thin films are polycrystalline and have the cubic structure with preferential orientation in the [111] direction, and the crystal structure of the films were improved due to doping process. From d.c.electrical conductivity in range of (291-495)K, we noticed that there are two activation energies Ea1 and Ea2, and their values decrease with the..increase.of.Zn.percentages,so..(σd.c.)..of..those..thin.films.increase . From Hall.effect. measurements we showed that the..(σd.c.).. for CdTe thin film is of n-type and converted to p-type when they adopted with Zn, and charge carrier concentration increases with the increase of Zn percentages, so Hall mobility (μH) decreases
Study the Effect of Zn Doping in the Structural and Electrical Properties of CdTe Thin Films
CdTe
doping with Zn
Structural and Electrical Properties.
Publication Date
Wed Apr 25 2018
Journal Name
Ibn Al-haitham Journal For Pure And Applied Sciences
Different Estimation Methods for System Reliability Multi-Components model: Exponentiated Weibull Distribution
Exponentiated Weibull Distribution (EWD)
Reliability of multi-component Stress – Strength models R(s
k)
Maximum likelihood estimator (MLE)
Moment estimator (MOM)
shrinkage method (Sh)
Least Squares Estimator (LS)
Rank Set Sampling (RSS). and mean squared error (MSE).
In this paper, estimation of system reliability of the multi-components in stress-strength model R(s,k) is considered, when the stress and strength are independent random variables and follows the Exponentiated Weibull Distribution (EWD) with known first shape parameter θ and, the second shape parameter α is unknown using different estimation methods. Comparisons among the proposed estimators through Monte Carlo simulation technique were made depend on mean squared error (MSE) criteria
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