This survey investigates the thermal evaporation of Ag2Se on glass substrates at various thermal
annealing temperatures (300, 348, 398, and 448) °K. To ascertain the effect of annealing
temperature on the structural, surface morphology, and optical properties of Ag2Se films,
investigations and research were carried out. The crystal structure of the film was described by Xray diffraction and other methods.The physical structure and characteristics of the Ag2Se thin films
were examined using X-ray and atomic force microscopy (AFM) based techniques. The Ag2Se
films surface morphology was examined by AFM techniques; the investigation gave average
diameter, surface roughness, and grain size mutation values with increasing annealing temperature
(75.74 nm–96.36 nm). Additionally, With various variations to the nominal values, the absorbance
and transmittance spectra are further studied and reported in accordance with the wavelength range
of (400-1100) nm. The findings indicate that the sample highest absorbance value was attained at
a temperature treatment of 448 K, whereas the sample highest transmittance was at a temperature
treatment of 300 K. According to the results, direct transitions were permitted in the under-review
thin films at optical energies of (2.15, 1.85, 1.75, and 1.7) eV, respectively
