In this paper, a new class of sets, namely - semi-regular closed sets is introduced and studied for topological spaces. This class properly contains the class of semi--closed sets and is property contained in the class of pre-semi-closed sets. Also, we introduce and study srcontinuity and sr-irresoleteness. We showed that sr-continuity falls strictly in between semi-- continuity and pre-semi-continuity.

  The search is an application for one of the problems of mathematics in the computer; as providing construction and design of a major program to calculate the inverse permutations of the symmetric group Sn , where 1 ≤ n ≤ 13; using some of the methods used in the Number Theory by computer . Also the research includes design flow chart for the main program and design flow chart for the program inverse permutations and we give some illustrative examples for different symmetric groups and their inverse permutations.

A thin CdS Films have been evaporated by thermal evaporation technique with different thicknesses (500, 1000, 1500 and 2000Å) and different duration times of annealing (60, 120 180 minutes) under 573 K annealing temperature, the vacuum was about 8 × 10-5 mbar and substrate temperature was 423 K. The structural properties of the films have been studied by X- ray diffraction technique (XRD). The crystal growth became stronger and more oriented as the film thickness (T) and duration time of annealing ( Ta) increases.

Let R be a commutative ring with identity and let M be a unitary left R-module. The purpose of this paper is to investigate some new results (up to our knowledge) on the concept of semi-essential submodules which introduced by Ali S. Mijbass and Nada K. Abdullah, and we make simple changes to the definition relate with the zero submodule, so we say that a submodule N of an R-module M is called semi-essential, if whenever N ∩ P = (0), then P = (0) for each prime submodule P of M. Various properties of semi-essential submodules are considered.

Thin films of highly pure (99.999%) Tellurium was prepared by high vacuum technique (5*10-5torr), on glass substrates .Thin films have thickness 0.6m was evaporated by thermal evaporation technique. The film deposited was annealed for one hour in vacuum of (5*10-4torr) at 373 and 423 K. Structural and electrical properties of the films are studies. The x-ray diffraction of the film represents a poly-crystalline nature in room temperature and annealed film but all films having different grain sizes. The d.c. electrical properties have been studied at low and at relatively high temperatures and show that the conductivity decreases with increasing temperature at all range of temperature. Two types of conduction mechanisms were found to d

Different thicknesseses of polycrystalline ZnTe films have been deposited on to glass substrates by vacuum evaporation technique under vacuum 2.1x10-5 mbar. The structural characteristics studied by X-ray diffraction (XRD) showed that the films are polycrystalline and have a cubic (zinc blende ) structure. The calculated microstructure parameters revealed that the crystallite size increases with increasing film thicknesses. The optical measurements on the deposited films were performed in different thicknesseses [ 400 , 450 and 500]nm, to determine the transmission spectrum and the absorption spectra as a function of incident wavelength. The optical absorption coefficient (α) of the films was determined from transmittance spectra in t

In this study, two correlations are developed to calculate absolute rocks permeability from core samples tested by Gas Permeameter Apparatus. The first correlation can be applied if K g≤100, the second correlation can be applied if Kg>100. Sixty core samples having different permeabilities to give a wide range of values that necessary to achieve a correlation.

The developed correlation is easily applied and a quick method to avoid repeating the test at different pressure values. Only one pressure test is required to reach absolu