In this research, the semiparametric Bayesian method is compared with the classical method to estimate reliability function of three systems : k-out of-n system, series system, and parallel system. Each system consists of three components, the first one represents the composite parametric in which failure times distributed as exponential, whereas the second and the third components are nonparametric ones in which reliability estimations depend on Kernel method using two methods to estimate bandwidth parameter h method and Kaplan-Meier method. To indicate a better method for system reliability function estimation, it has been used simulation procedure for comparison and different sample sizes of size (14,30,60 and 100) using standard comparison Integral Mean Square Error (IMSE). For k-out of-n system, the results indicate that it is better to use Bayesian method for samples of size (30,60 and 100), and to use the classical method for samples of size (14), whereas for series system the best method to use is Bayesian method for samples of size (14,60 and 100) , and to use the classical method for sample of size (30). for parallel system, it is better to use Bayesian method for all sample sizes.
The present paper discusses morphological and syntactic structures of time in Russian language. The morphological and syntactic structures are considered part component of time category in Russian language.
The morphological categories of time are formed through a various types of expressions .Tenses generally express time relative to the moment of speaking. In some contexts, however, their meaning may be relativized to a point in the past ,present or future which is established in the discourse .Some languages have different verb forms or constructions and that are opposed in meaning not in syntactic category. Hence, the present study traces and compares the syntacti
... Show More
Statistical control charts are widely used in industry for process and measurement control . in this paper we study the use of markov chain approach in calculating the average run length (ARL) of cumulative sum (Cusum) control chart for defect the shifts in the mean of process , and exponentially weighted moving average (EWMA) control charts for defect the shifts for process mean and , the standard deviation . Also ,we used the EWMA charts based on the logarithm of the sample variance for monitoring a process standard deviation when the observations (products are selected from al_mamun factory ) are identically and independently distributed (iid) from normal distribution in continuous manufacturing .