Background: Oral squamous cell carcinoma is the most prevalent malignant neoplasm of the oral cavity which results from accumulated genetic and epigenetic alterations. It is not always inexorable and may be reversible if early intervention in the process can occur to prevent further genetic mutation and disease progression. The FHIT gene is a tumor suppressor gene located in FRA3B region which is the most active common fragile site, where DNA damage leading to aberrant transcripts and translocations frequently occur. The WWOX is a tumor suppressor gene that plays a central role in tumor suppression through transcriptional repression and apoptosis, with its apoptotic function the more prominent of the two. This study aimed to evaluate and compare the immunohistochemical expression of FHIT and WWOX in normal oral mucosa, oral epithelial dysplasia and oral squamous cell carcinoma and to correlate the expression of the mentioned markers with the clinicopathological features and to show the expression of studied markers with each other. Materials and methods: Fifty formalin-fixed, paraffin embedded tissue blocks (10 cases of normal oral mucosa, 19 cases of oral epithelial dysplasia, and 21 cases of oral squamous cell carcinoma) were included in this study. Immunohistochemical staining was performed using anti FHIT polyclonal antibody, and anti WWOX polyclonal antibody. Results: Positive IHC of FHIT was detected with high score in all cases of NOM, 16 cases (84%) of OED and 18 cases (86%) of OSCC. For WWOX expression positive IHC detected with high score in all cases (100%) of NOM, 14 cases (74%) of OED and 15 cases (71%) of OSCC. There was statistically highly significant correlation of both markers in OED and non significant correlation in OSCC, with significant differences among studied groups. Conclusions: These results signifying both markers cooperative tumor suppressive role and potential pathological transition from normal oral mucosa to dysplastic epithelium and subsequently cause malignant oral lesions.
The current study aims to identify the artistic expression as well as the aspects of artistic expression by the painting among the kindergarten children. In order to fulfill the research's goals, a sample of (400) children were chosen randomly from 19 public kindergartens of 6 directorates at Al-Rusafa and Al-Karkh in Baghdad city. The children were asked to draw a particular view. The researcher has adopted Al-Hamedawi scale (2009) consisted of (16) items, which was exposed to group of (25) experts in psychology, education, measurement and evaluation, artistic education by painting and plastics to show the items reliability. As the researcher applied T-test for 
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New chelating ligand derived from triazole and its complexes with metal ions Rhodium, Platinum and Gold were synthesized. Through a copper (I)-catalyzed click reaction, the ligand produced 1,3-dipolar cycloaddition between 2,6-bis((prop-2-yn-1-yloxy) methyl) pyridine and 1-azidododecane. All structures of these new compounds were rigorously characterized in the solid state using spectroscopic techniques like: 1HNMR, 13CNMR, Uv-Vis, FTIR, metal and elemental analyses, magnetic susceptibility and conductivity measurements at room temperature, it was found that the ligand acts as a penta and tetradentate chelate through N3O2, N2O2, and the geometry of the new complexes are identified as octahedral for (Rh & Pt) complexes a
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New chelating ligand derived from triazole and its complexes with metal ions Rhodium, Platinum and Gold were synthesized. Through a copper (I)-catalyzed click reaction, the ligand produced 1,3-dipolar cycloaddition between 2,6-bis((prop-2-yn-1-yloxy) methyl) pyridine and 1-azidododecane. All structures of these new compounds were rigorously characterized in the solid state using spectroscopic techniques like: 1HNMR, 13CNMR, Uv-Vis, FTIR, metal and elemental analyses, magnetic susceptibility and conductivity measurements at room temperature, it was found that the ligand acts as a penta and tetradentate chelate through N3O2, N2O2, and the geometry of the new complex
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High cost of qualifying library standard cells on silicon wafer limits the number of test circuits on the test chip. This paper proposes a technique to share common load circuits among test circuits to reduce the silicon area. By enabling the load sharing, number of transistors for the common load can be reduced significantly. Results show up to 80% reduction in silicon area due to load area reduction.
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