Nowadays, internet security is a critical concern; the One of the most difficult study issues in network security is "intrusion detection". Fight against external threats. Intrusion detection is a novel method of securing computers and data networks that are already in use. To boost the efficacy of intrusion detection systems, machine learning and deep learning are widely deployed. While work on intrusion detection systems is already underway, based on data mining and machine learning is effective, it requires to detect intrusions by training static batch classifiers regardless considering the time-varying features of a regular data stream. Real-world problems, on the other hand, rarely fit into models that have such constraints. Furthermor

The rapid development of telemedicine services and the requirements for exchanging medical information between physicians, consultants, and health institutions have made the protection of patients’ information an important priority for any future e-health system. The protection of medical information, including the cover (i.e. medical image), has a specificity that slightly differs from the requirements for protecting other information. It is necessary to preserve the cover greatly due to its importance on the reception side as medical staff use this information to provide a diagnosis to save a patient's life. If the cover is tampered with, this leads to failure in achieving the goal of telemedicine. Therefore, this work provides an in

There are large numbers of weakness in the generated keys of security algorithms. This paper includes a new algorithm to generate key of 5120 bits for a new proposed cryptography algorithm for 10 rounds that combine neural networks and chaos theory (1D logistic map). Two methods of neural networks (NN) are employed as Adaline and Hopfield and the results are combined through several sequential operation. Carefully integrating high quality random number generators from neural networks and chaos theory to obtain suitable key for randomness and complexity.

New data on jumping spiders (Salticidae) and tangle-web spiders (Theridiidae) of Armenia are provided on the basis of recently collected specimens in various regions of Armenia. One species, Ballus rufipes (Simon, 1868) is recorded as new to the Caucasus Region, in addition to the following species: Neon reticulatus (Blackwall, 1853), Pellenes brevis (Simon, 1868), Salticus scenicus (Clerck, 1757) and Synageles dalmaticus (Keyserling, 1863) that belong to a family Salticidae, are recorded in Armenia for the first time.
A further 7 species of Theridiidae are recorded in Armenia for the first time Kochiura aulica (C. L. Koch, 1838), Steatoda albomaculata (De Geer, 1778), Steatoda bipunctata (Linnaeus, 1758), Steatoda castanea Clerk, 175

The detection of diseases affecting wheat is very important as it relates to the issue of food security, which poses a serious threat to human life. Recently, farmers have heavily relied on modern systems and techniques for the control of the vast agricultural areas. Computer vision and data processing play a key role in detecting diseases that affect plants, depending on the images of their leaves. In this article, Fuzzy- logic based Histogram Equalization (FHE) is proposed to enhance the contrast of images. The fuzzy histogram is applied to divide the histograms into two subparts of histograms, based on the average value of the original image, then equalize them freely and independently to conserve the brightness of the image. The prop

Silver selenide telluride Semiconducting (Ag2Se0.8Te0.2) thin films were by thermal evaporation at RT with thickness350 nm at annealing temperatures (300, 348, 398, and 448) °K for 1 hour on glass substrates .using X-ray diffraction, the structural characteristics were calculated as a function of annealing temperatures with no preferential orientation along any plane. Atomic force microscopy (AFM) and X-ray techniques are used to analyze the Ag2SeTe thin films' physical makeup and properties. AFM techniques were used to analyze the surface morphology of the Ag2SeTe films, and the results showed that the values for average diameter, surface roughness, and grain size mutation increased with annealing temperature (116.36-171.02) nm The transm

Silver selenide telluride Semiconducting (Ag2Se0.8Te0.2) thin films were by thermal evaporation at RT with thickness350 nm at annealing temperatures (300, 348, 398, and 448) °K for 1 hour on glass substrates .using X-ray diffraction, the structural characteristics were calculated as a function of annealing temperatures with no preferential orientation along any plane. Atomic force microscopy (AFM) and X-ray techniques are used to analyze the Ag2SeTe thin films' physical makeup and properties. AFM techniques were used to analyze the surface morphology of the Ag2SeTe films, and the results showed that the values for average diameter, surface roughness, and grain size mutation increased with annealing temperature (116.36-171.02) nm The transm

This study focuses on synthesizing Niobium pentoxide (Nb₂O₅) thin films on silicon wafers and quartz substrates using DC reactive magnetron sputtering for NO₂ gas sensors. The films undergo annealing in ambient air at 800 °C for 1 hr. Various characterization techniques, including X-ray diffraction (XRD), atomic force microscopy (AFM), energy-dispersive X-ray spectroscopy (EDS), Hall effect measurements, and sensitivity measurements, are employed to evaluate the structural, morphological, electrical, and sensing properties of the Nb₂O₅ thin films. XRD analysis confirms the polycrystalline nature and hexagonal crystal structure of Nb₂O₅. The optical band gap val

This study focuses on synthesizing Niobium pentoxide (Nb2O5) thin films on silicon wafers and quartz substrates using DC reactive magnetron sputtering for NO2 gas sensors. The films undergo annealing in ambient air at 800 °C for 1 hr. Various characterization techniques, including X-ray diffraction (XRD), atomic force microscopy (AFM), energy-dispersive X-ray spectroscopy (EDS), Hall effect measurements, and sensitivity measurements, are employed to evaluate the structural, morphological, electrical, and sensing properties of the Nb2O5 thin films. XRD analysis confirms the polycrystalline nature and hexagonal crystal structure of Nb2O5. The optical band gap values of the Nb2O5 thin films demonstrate a decrease from 4.74 to 3.73 eV