In this paper, a polymer-based composite material was prepared by hand Lay-up method consisting of epoxy resin as a base material filled with by magnesium oxide powder once and silicon dioxide powder again and with different weight ratios (3%, 6%, 9%, 12%). The three-point bending test was performed in normal conditions and after immersion in sulfuric acid. The results showed that the bending value decreased with the increase of the weighted ratio of the filled nano powder (MgO, SiO2) .The Bending of samples filled with by SiO2 was found to be less than the bending of samples filled with by particles (MgO), the bending of the SiO2 sample (0.32mm) at the weighted ratio (3%) and for the MgO (0.18mm) sample at the weight ratio were the same at the same weighted load (100 g). It was found that the bending values of all samples exceeded the value after immersion in sulfuric acid. The percentage of weight (6%) at the load level (500 g) was changed from 1.16mm in normal conditions to 1.48mm for the same weight ratio after immersion. In sulfuric acid diluted with 0.3N for 10 days at the same Applied load.
Nanofluids are proven to be efficient agents for wettability alteration in subsurface applications including enhanced oil recovery (EOR). Nanofluids can also be used for CO2-storage applications where the CO2-wet rocks can be rendered strongly water-wet, however no attention has been given to this aspect in the past. Thus in this work we presents contact angle (θ) measurements for CO2/brine/calcite system as function of pressure (0.1 MPa, 5 MPa, 10 MPa, 15 MPa, and 20 MPa), temperature (23 °C, 50 °C and 70 °C), and salinity (0, 5, 10, 15, and 20% NaCl) before and after nano-treatment to address the wettability alteration efficiency. Moreover, the effect of treatment pressure and temperature, treatment fluid concentration (SiO2 wt%) and
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: Porous silicon (n-PS) films can be prepared by photoelectochemical etching (PECE) Silicon chips n - types with 15 (mA /cm2), in15 minutes etching time on the fabrication nano-sized pore arrangement. By using X-ray diffraction measurement and atomic power microscopy characteristics (AFM), PS was investigated. It was also evaluated the crystallites size from (XRD) for the PS nanoscale. The atomic force microscopy confirmed the nano-metric size chemical fictionalization through the electrochemical etching that was shown on the PS surface chemical composition. The atomic power microscopy checks showed the roughness of the silicon surface. It is also notified (TiO2) preparation nano-particles that were prepared by pulse laser eradication in e
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