In the present work, lead silicate glasses have been prepared with
different amount of lead oxide content. Structure properties such as
X-ray diffraction, AFM, and FTIR analyses have been done. The
exceeding of PbO content more than 25wt% revealed a decreasing in
density. The X- ray revealed that the strongest peak related to
Hexagonal silica dioxide and the other crystal phases formed were
related to silica oxide (SiO2) and lead oxide (PbO). Growth and
decayed phases in X-ray have been observed with changing lead
oxide content. Homogeneous surface was obtained using AFM
analyzer with an average diameter around 100 nm. Infrared spectrum
is characterized by the presence of large absorption band between
1200 and 900cm-1 and have its maximum at 1080 cm-1 which is
typical to stretching vibrations of Si–O–Si bonds, another bands
noticed were attributed to Pb–O–Pb, Pb–O–Si, [AlO4]-tetrahedron,
and to Si–O–Al bond.
The physical, mechanical, electrical and thermal properties containing (Viscosity, curing, adhesion force, Tensile strength, Lap shear strength, Resistively, Electrical conductivity and flammability) of adhesive material that prepared from Nitrocellulose reinforced with graphite particles and aluminum streat. A comparison is made between the properties of adhesive material with varying percentage of graphite powder (0%, 25%, 30%, 35%, 40%) to find out the effect of reinforcement on the adhesive material. The ability of property an electrical was studied through the measurement of conductivity a function of temperature varying. The results of comparison have clearly shown that the increasing of conten
... Show MoreIn this work, thin films of undoped and Al-doped CdO with (0.5, 1 and 2) wt.% were prepared by using thermal vacuum evaporation on glass substrate at room temperature. The optical absorption coefficient (α) of the films was determined from transmittance spectra in the range of wavelength (400-1100) nm. The spectral transmission and the optical energy band gap decrease from 75% and 2.24 eV to 20% and 2.1 eV respectively depending upon the Al content in the films, also our studies include the calculation of the optical constants (refractive index, extinction coefficient, real and imaginary part of dielectric constant) as a function of photon energy. It is evaluated that the optical band gap of
... Show MoreAccording to the theory of regular geometric functions, the relevance of geometry to analysis is a critical feature. One of the significant tools to study operators is to utilize the convolution product. The dynamic techniques of convolution have attracted numerous complex analyses in current research. In this effort, an attempt is made by utilizing the said techniques to study a new linear complex operator connecting an incomplete beta function and a Hurwitz–Lerch zeta function of certain meromorphic functions. Furthermore, we employ a method based on the first-order differential subordination to derive new and better differential complex inequalities, namely differential subordinations.
TiO2 thin films have been deposited at different concentration of
CdO of (x= 0.0, 0.05, 0.1, 0.15 and 0.2) Wt. % onto glass substrates
by pulsed laser deposition technique (PLD) using Nd-YAG laser
with λ=1064nm, energy=800mJ and number of shots=500. The
thickness of the film was 200nm. The films were annealed to
different annealing (423 and 523) k. The effect of annealing
temperatures and concentration of CdO on the structural and
photoluminescence (PL) properties were investigated. X-ray
diffraction (XRD) results reveals that the deposited TiO2(1-x)CdOx
thin films were polycrystalline with tetragonal structure and many
peaks were appeared at (110), (101), (111) and (211) planes with
preferred orientatio
Copper oxide thin films were synthesized by using spray pyrolysis deposition technique, in the temperature around 400°C in atmosphere from alcoholic solutions. Copper (II) chloride as precursor and glass as a substrate. The textural and structural properties of the films were characterized by atomic force microscopy (AFM), X-ray diffraction (XRD). The average particle size determined from the AFM images ranged from 30 to 90 nm and the roughness average was equal to 9.3 nm. The XRD patterns revealed the formation of a polycrystalline hexagonal CuO. The absorption and transmission spectrum, band gap, film thickness was investigated. The films were tested as an |