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On the Use of 6th-Order Tunable Complementary Metal-Oxide-Semiconductor Varactor based Filter in Ultra-Wideband Low Noise Amplifier
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Background:

The plethora of the emerged radio frequency applications makes the frequency spectrum crowded by many applications and hence the ability to detect specific application’s frequency without distortion is a difficult task to achieve.

Objective:

The goal is to achieve a method to mitigate the highest interferer power in the frequency spectrum in order to eliminate the distortion.

Method:

This paper presents the application of the proposed tunable 6th-order notch filter on Ultra-Wideband (UWB) Complementary Metal-Oxide-Semiconductor (CMOS) Low Noise Amplifier (LNA) utilising self-forward body bias (SFBB).

Results:

The proposed filter presents 23.5dBm minimum interferer rejection (IR) and attenuates the interferer signal from -43dBm to -67dBm at frequency 5.17GHz. In addition, the maximum IR is 40dBm and attenuates the interferer signal from -41dBm to -81dBm at frequency 5.785GHz. The proposed filter provides coarse tuning with frequency spacing (10MHz) and soft tuning with frequency spacing (1MHz). The UWB CMOS LNA consumes only 5.22mW from a supply voltage of 1.2V and presents a maximum gain of 14dB at frequency 6.25GHz in the -3dB bandwidth from 4.75GHz to 7.5GHz. In addition, the average noise figure is 3.1dB and the input insertion losses (S11) is less than -12dB along the designed bandwidth. The simulation is performed in Advanced Design System (ADS2016.01) software utilising 180nm Taiwan Semiconductor Manufacturing Company (TSMC) Berkeley Short-channel Insulated Gate Field Effect Model (BSIM3v3) model files.

Conclusion:

The proposed method achieves high interferer power rejection with both soft and coarse tuning.

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Mon Jan 01 2024
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Encryption of Medical Image Based on Cascaded Design of AES Block Algorithm and Chaotic Map
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Mon May 11 2020
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DEO: A Dynamic Event Order Strategy for t-way Sequence Covering Array Test Data Generation
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Sequence covering array (SCA) generation is an active research area in recent years. Unlike the sequence-less covering arrays (CA), the order of sequence varies in the test case generation process. This paper reviews the state-of-the-art of the SCA strategies, earlier works reported that finding a minimal size of a test suite is considered as an NP-Hard problem. In addition, most of the existing strategies for SCA generation have a high order of complexity due to the generation of all combinatorial interactions by adopting one-test-at-a-time fashion. Reducing the complexity by adopting one-parameter- at-a-time for SCA generation is a challenging process. In addition, this reduction facilitates the supporting for a higher strength of

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Mon May 11 2020
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Baghdad Science Journal
DEO: A Dynamic Event Order Strategy for t-way Sequence Covering Array Test Data Generation
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Sequence covering array (SCA) generation is an active research area in recent years. Unlike the sequence-less covering arrays (CA), the order of sequence varies in the test case generation process. This paper reviews the state-of-the-art of the SCA strategies, earlier works reported that finding a minimal size of a test suite is considered as an NP-Hard problem. In addition, most of the existing strategies for SCA generation have a high order of complexity due to the generation of all combinatorial interactions by adopting one-test-at-a-time fashion. Reducing the complexity by adopting one-parameter- at-a-time for SCA generation is a challenging process. In addition, this reduction facilitates the supporting for a higher strength of cove

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The preparation and characterization of some metal complexes with tridentate ONO ligand derived from phenyl hydrazine
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The phenyl hydrazine was react readily with acetic acid chloride in [1:2] ratio in alkyl of ethanolic solution, and refluxe for five hours to produce a new ligand of (N-Carboxymethyl-N-phenyl-hydrazino)-acetic acid [H2L].

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