In this research, thin films of CdO: Mg and n-CdO: Mg/ p-Si heterojunction with thickness (500±50) nm have been deposited at R.T (300 K) by thermal evaporation technique. These samples have been annealed at different annealing temperatures (373 and 473) K for one hour. Structural, optical and electrical properties of {CdO: Mg (1%)} films deposited on glass substrate as a function of annealing temperature are studied in detail. The C-V measurement of n-CdO: Mg/ p-Si heterojunction (HJ) at frequency (100 KHz) at different annealing temperatures have shown that these HJ were of abrupt type and the builtin potential (Vbi) increase as the annealing temperature increases. The I-V characteristics of heterojunction prepared under dark case at

The Boltzmann transport equation is solved by using two- terms approximation for pure gases and mixtures. This method of solution is used to calculate the electron energy distribution function and electric transport parameters were evaluated in the range of E/N varying from . 172152110./510.VcmENVcm
The electron energy distribution function of CF4 gas is nearly Maxwellian at (1,2)Td, and when E/N increase the distribution function is non Maxwellian. Also, the mixtures are have different energy values depending on transport energy between electron and molecule through the collisions. Behavior of electrons transport parameters is nearly from the experimental results in references. The drift velocity of electron in carbon tetraflouride i

     In this paper, some estimators for the unknown shape parameter and reliability function of Basic Gompertz distribution have been obtained, such as Maximum likelihood estimator and Bayesian estimators under Precautionary loss function using Gamma prior and Jefferys prior. Monte-Carlo simulation is conducted to compare mean squared errors (MSE) for all these estimators for the shape parameter and integrated mean squared error (IMSE's) for comparing the performance of the Reliability estimators. Finally, the discussion is provided to illustrate the results that summarized in tables.

     In this work, the methods (Moments, Modified Moments, L-Moments, Percentile, Rank Set sampling and Maximum Likelihood) were used to estimate the reliability function and the two parameters of the Transmuted Pareto (TP) distribution. We use simulation to generate the required data from three cases this indicates  sample size , and it replicates  for the real value for parameters, for reliability times values  we take .

Results were compared by using mean square error (MSE), the result appears as follows :

The best methods are Modified Moments, Maximum likelihood and L-Moments in first case, second case and third case respectively.

The experiences in the life are considered important for many fields, such as industry, medical and others. In literature, researchers are focused on flexible lifetime distribution.

In this paper, some Bayesian estimators for the unknown scale parameter  of Inverse Rayleigh Distribution have been obtained, of different two loss functions, represented by Suggested and Generalized loss function based on Non-Informative prior using Jeffery's and informative prior represented by Exponential distribution. The performance of   estimators is compared empirically with Maximum Likelihood estimator, Using Monte Carlo Simulation depending on the Mean Square Error (MSE). Generally, the preference of Bayesian method of Suggeste

     We have presented the distribution of the exponentiated expanded power function (EEPF) with four parameters, where this distribution was created by the exponentiated expanded method created by the scientist Gupta to expand the exponential distribution by adding a new shape parameter to the cumulative function of the distribution, resulting in a new distribution, and this method is characterized by obtaining a distribution that belongs for the exponential family. We also obtained a function of survival rate and failure rate for this distribution, where some mathematical properties were derived, then we used the method of maximum likelihood (ML) and method least squares developed  (LSD)

In this work the effect of annealing temperature on the structure and the electrical properties of Bi thin films was studied, the Bi films were deposited on glass substrates at room temperature by thermal evaporation technique with thickness (0.4 µm) and rate of deposition equal to 6.66Å/sec, all samples are annealed in a vacuum for one hour. The X-ray diffraction analysis shows that the prepared samples are polycrystalline and it exhibits hexagonal structure. The electrical properties of these films were studied with different annealing temperatures, the d.c conductivity for films decreases from 16.42 ? 10-2 at 343K to 10.11?10-2 (?.cm)-1 at 363K. The electrical activation energies Ea1 and Ea2 increase from 0.031 to 0.049eV and