In this search, Ep/SiO2 at (3, 6, 9, 12 %) composites is prepared by hand Lay-up method, to measure the change in the thermal conductivity and Impact Strength of epoxy resin before and after immersion in H2SO4 Solution with a 0.3N for 10 days. The results before immersion decreases with the increase of the weight ratios of the reinforcement material (SiO2), It changed from (82.6×10-2 to 38.7×10-2 W/m.°C) with change weight ratios from (3 to 12) % respectively, but after immersion time in the chemical solution where it was (65.6×10-2 W/m.°C) at the weight ratios (6 %) and became (46.6 × 10-2 W/m.°C) after immersion in sulfuric acid. The results of the Impact strength decreased by increasing the percentage weight ratio, it changed f

In this work, Titanium oxide thin films doped with different concentration of CuO (0,5,10, 15,20) %wt were prepared by pulse laser deposition(PLD) technique on glass substrates at room temperature with constant deposition parameter such as : pulse (Nd:YAG), laser with λ=1064 nm, constant energy 800 mJ , repetition rate 6 Hz and No. of pulse (500). The structure , optical and electrical properties were studied . The results of X-ray diffraction( XRD) confirmed that the film grown by this technique have good crystalline tetragonal mixed anatase and rutile phase structure, The preferred orientation was along (110) direction for Rutile phase. The optical properties of the films were studied by UV-VIS spectrum in the range of (360-1100)

      In the present investigation, (NiO:WO₃ ) thin films were deposited at RT onto glass substrates  using PLD technique employing focused Nd:YAG laser beam at 600 mJ with a frequency second radiation at 1064 nm (pulse width 9 ns) repetition frequency (6 Hz), for 400 laser pulses incident on the target surface .The structural, morphological and optical properties of the films doped with  different concentration of  Au content (0.03, 0.05, and 0.07) were examined with X-ray diffractometer(XRD), Atomic Force Microscope(AFM) , UV–Vis spectrophotometer . The results show that the films were amorphous with small peaks appearing when doped with AuNPs . The XRD peaks of the deposited NiO:WO3 were enhanced with increasing t

The synthesis and structural characterization of new dithiocarbamate (DTC) ligand and some of its dinuclear transition metal complexes are described. The free dithiocarbamate ligand was prepared through several synthetic routes, including Schiff-base formation. The reaction of 2-aminopropane with terephthaldehyde leads to the formation of Schiff^_base which is reduced by methanolic NaBH₄ to the corresponding secondary diamine. Diamine( N,N'^_ (1,4 phenylenebis (methylene)) bis(propan-2 amine))  reacts with (CS₂) in a basic solution of (KOH) to provide the corresponding bis(dithiocarbamate) free^_ligand, which undergoes complexation with the appropriate metal   (II) chlori

    This experiment was conducted in field of Agricultured Department Baquba/Diyala province in spring season 2011 to study the water stress by using foliar application concentrations of each Proline acid and Abscisic acid on proline content , ABA  content , chlorophyll content, protein conten and water content in leaves of Maize( cultivar, Buhooth 106).  The layout of the experiments was Split-  split plot design as RCBD with three replicates. The three concentrations   of spraying Proline acid levels ( 0 , 150 , 200 mg Proline .l-1 ) Three Abscisic acid levels ( 0 , 15 , 20 mgABA.l-1. ) and three periods of irrigation after(25, 50, 75%) of available water . Folair fertilizer were applied at three

In this paper, the effect of films thickness on the structural and optical properties of gold (Au) thin films prepared by the DC sputtering method was studied. At three different deposition times, three samples of gold thin films of three different thicknesses (200,400, and 600 nm) were prepared. X-ray diffraction patterns, scanning electron microscopy (SEM), and atomic force microscopy (AFM) images, as well as optical spectroscopy, were used to characterize thin films. The crystalline structure of gold thin films was determined by the XRD pattern which showed to be cubic phase and polycrystalline in nature. The preferred orientation was (111) at 2Ѳ equal 37.4. The effect of deposition time on the morphology of the deposited films was v

In this research, the study effect of irradiation on structural and optical properties of thin film (CdO) by spray pyrolysis method, which deposited on glasses substrates at a thickness of (350±20)nm , The flow rate of solution was 5 ml/min and the substrate temperature was held constant at 400˚C.The investigation of (XRD) indicates that the (CdO) films are polycrystalline and type of cubic. The results of the measuring of each sample from grain size, micro strain, dislocation density and number of crystals the grain size decreasing after irradiation with gamma ray from(27.41, 26.29 ,23.63)nm . The absorbance and transmittance spectra have been recorded in the wavelength range (300-1100) nm in order to study the optical properties.

     Well log rock physics and seismic facies analysis was carried out with a view to enhancing reservoir sand characterization of Mafe Field of Niger Delta. Lithofacies were identified using suites of well logs and correlated across the block. Rock properties were estimated from wireline logs using empirical methods. Vp-porosity crossplot was used to characterize the delineated sandstone reservoirs by comparing observed clusters and trends with various rock physics models. Seismic attribute analysis was employed to detect lateral changes in lithology across the field. Reservoir A is a relatively clean sand, with low average volume of shale of 0.4, average thickness of 55m, good average porosity of 0.

Porous silicon (PS) layers are prepared by anodization for
different etching current densities. The samples are then
characterized the nanocrystalline porous silicon layer by X-Ray
Diffraction (XRD), Atomic Force Microscopy (AFM), Fourier
Transform Infrared (FTIR). PS layers were formed on n-type Si
wafer. Anodized electrically with a 20, 30, 40, 50 and 60 mA/cm2
current density for fixed 10 min etching times. XRD confirms the
formation of porous silicon, the crystal size is reduced toward
nanometric scale of the face centered cubic structure, and peak
becomes a broader with increasing the current density. The AFM
investigation shows the sponge like structure of PS at the lower
current density porous begi