in this paper copper oxide (cuO thin films were prepared by the method of vacum thermal evaporation a pressure.
Mesoporous SBA-15 with nono particle size distribution, different texture properties, and morphologies have been synthesized by controlling the hydrophilic-hydrophobic character during preparation, i.e., the solubility of micelles of pluronic P123 by controlling the charge of PEO hydrophilic-inorganic silica zone using different charge surfactants CTAB (cationic), F68 (nonionic), and SDBS (anionic). Sodium silicate was used as a silica source. Eo20Po70Eo20 co-polymer was used as a template at highly acidic conditions (pH<2). The experiments were characterized using XRD, FTIR, AFM, BET, and FESEM. The XRD and FTIR tests indicated that the SBA-15 is amorphous and free from impurities. The degree of particle dispersion is sequenced
... Show MoreChalcopyrite thin films ternary Silver Indium Diselenide AgInSe2 (AIS) pure and Aluminum Al doped with ratio 0.03 was prepared using thermal evaporation with a vacuum of 7*10-6 torr on glass with (400) nm thickness for study the structural and optical properties. X-ray diffraction was used to show the inflance of Al ratio dopant on structural properties. X-ray diffraction show that thin films AIS pure, Al doped at RT and annealing at 573 K are polycrystalline with tetragonal structure with preferential orientation (112). raise the crystallinity degree. AFM used to study the effect of Al on surfaces roughness and Grain Size Optical properties such as the optical band gap, absorption coefficient, Extinction coefficient, refractive ind
... Show MoreZinc-indium-selenide ZnIn2Se4 (ZIS) ternary chalcopyrite thin film on glass with a 500 nm thickness was fabricated by using the thermal evaporation system with a pressure of approximately 2.5×10−5 mbar and a deposition rate of 12 Å/s. The effect of aluminum (Al) doping with 0.02 and 0.04 ratios on the structural and optical properties of film was examined. The utilization of X-ray diffraction (XRD) was employed to showcase the influence of aluminum doping on structural properties. XRD shows that thin ZIS-pure, Al-doped films at RT are polycrystalline with tetragonal structure and preferred (112) orientation. Where the