In the present work the preparation of Cu2S alloy was done throughout mixing the sulphur and copper elements according to the proper atomic weight and then put in an evacuated quartz ampoule which then sealed and heated at 1273 K for five hours and left to cool. Thin films from Cu2S powder thicknesses of ~300nm were prepared by thermal evaporation technique on a glass substrate and under vacuum of 10 -5 mbar with rate of deposition 25nm/sec. The prepared thin films subjected to heat treatment at different temperatures(300, 373 , 473 and 573 K)for half an hour. The structures of Cu2S powder and films have been studied by X–ray diffraction technique. The result reveals that the preparedalloy has cubic structure and coincides with slandered cards while the prepared thin films have amorphous structure. The optical measurement shows that the Cu2S films have direct and indirect energy gap energy gap (Eg opt ) for allowed transition. The energy gap (Eg opt ) increases slightly with the increase annealing temperature and retune to increase with further increases of annealing temperature. The energy gap (Eg opt ) increases from 2.55 to 2.6 eV and then decreases. The transmittance and optical constants such as refractive index (n), extinction coefficient (k) and dielectric constant (εr, εi) have been calculated. The optical constants decrease in the first and then return to increase with annealing temperature.
