Purpose: To compare the central corneal thickness (CCT),minimum corneal thickness (MCT) and corneal power measured using theScheimpflug-Placido device and optical coherence tomography (OCT) in healthy eyes. Study Design: Descriptive observational. Place and Duration of Study: Al-Kindy college of medicine/university of Baghdad, from June 2021 to April 2022. Methods: A total of 200 eyes of 200 individuals were enrolled in this study. CCT and MCT measurements were carried out using spectral-domain optical coherence tomography (Optovue) and a Scheimpflug-Placido topographer (Sirius).The agreement between the two approaches was assessed using Bland-Altman analysis in this study. Results: Mean age was 28.54 ± 6.6 years, mean spherical equivalent of refraction was -3.57 ± 3.35 D. Mean CCT by Optovue, and Sirius were534.13 ± 27.88 μm, and 540.2 ± 27.85μm, respectively.Mean CCT differences between them were -6.070± 6.593 μm, (p < 0.05). Minimum thickness by Optovue was 526.79 ± 27.81, and by Sirius was 537.44 ± 27.56, mean difference between the two devices was 10.66 ± 6.89,p= 0.00. The net power by OCT was 43.44 ± 1.456, mean K by Sirius was 43.597 ± 1.408, with p=0.000. Maximum level of agreement between the two devices is -18.99 to 6.85 for CCT, is widest for minimum thickness -24.166 to 2.85 and narrowest for differences between net corneal power by OCT and mean K By Sirius is -0.87 to 1.18. Conclusion: In clinical practice, the two devices cannot be used interchangeably. CCT and keratometry should be evaluated and followed up using the same device.
Theoretical calculation of the electronic current at N 3 contact with TiO 2 solar cell devices ARTICLES YOU MAY BE INTERESTED IN Theoretical studies of electronic transition characteristics of senstizer molecule dye N3-SnO 2 semiconductor interface AIP Conference. Available from: https://www.researchgate.net/publication/362813854_Theoretical_calculation_of_the_electronic_current_at_N_3_contact_with_TiO_2_solar_cell_devices_ARTICLES_YOU_MAY_BE_INTERESTED_IN_Theoretical_studies_of_electronic_transition_characteristics_of_senstiz [accessed May 01 2023].