The aim of this paper is to propose a reliable iterative method for resolving many types of Volterra - Fredholm Integro - Differential Equations of the second kind with initial conditions. The series solutions of the problems under consideration are obtained by means of the iterative method. Four various problems are resolved with high accuracy to make evident the enforcement of the iterative method on such type of integro differential equations. Results were compared with the exact solution which exhibits that this technique was compatible with the right solutions, simple, effective and easy for solving such problems. To evaluate the results in an iterative process the MATLAB is used as a math program for the calculations.

In this paper, a method based on modified adomian decomposition method for solving Seventh order integro-differential equations (MADM). The distinctive feature of the method is that it can be used to find the analytic solution without transformation of boundary value problems. To test the efficiency of the method presented two examples are solved by proposed method.

in this paper the collocation method will be solve ordinary differential equations of retarted arguments also some examples are presented in order to illustrate this approach

In this paper the modified trapezoidal rule is presented for solving Volterra linear Integral Equations (V.I.E) of the second kind and we noticed that this procedure is effective in solving the equations. Two examples are given with their comparison tables to answer the validity of the procedure.

In the present work, different thicknesses of CdS film were prepared by chemical bath deposition. Z-Scan technique was used to study the nonlinear refractive index and nonlinear absorption coefficients. Linear optical testing were done such as transmission test, and thickness of films were done by the interference fringes (Michelson interferometer). Z-scan experiment was performed at 650nm using CW diode laser and at 532nm wavelength. The results show the effect of self-focusing and defocusing that corresponds with nonlinear refraction n2. The effect of two-photon absorption was also studied, which correspond to the nonlinear absorption coefficient B.

In the present work is the deposition of copper oxide using the pulsed laser deposition technique using Reactive Pulsed Laser as a Deposition technique (RPLD), 1.064μm, 7 nsec Q-switch Nd-YAG laser with 400 mJ/cm2 laser energy’s has been used to ablated high purity cupper target and deposited on the porous silicon substrates recorded and study the effect of rapid thermal annealing on the structural characteristics, morphological, electrical characteristics and properties of the solar cell. Results of AFM likelihood of improved absorption, thereby reducing the reflection compared with crystalline silicon surface. The results showed the characteristics of the solar cell and a clear improvement in the efficiency of the solar cell in the

In this paper, we have been used the Hermite interpolation method to solve second order regular boundary value problems for singular ordinary differential equations. The suggest method applied after divided the domain into many subdomains then used Hermite interpolation on each subdomain, the solution of the equation is equal to summation of the solution in each subdomain. Finally, we gave many examples to illustrate the suggested method and its efficiency.

A comparative investigation of gas sensing properties of SnO2 doped with WO3 based on thin film and bulk forms was achieved. Thin films were deposited by thermal evaporation technique on glass substrates. Bulk sensors in the shape of pellets were prepared by pressing SnO2:WO3 powder. The polycrystalline nature of the obtained films with tetragonal structure was confirmed by X-ray diffraction. The calculated crystalline size was 52.43 nm. Thickness of the prepared films was found 134 nm. The optical characteristics of the thin films were studied by using UV-VIS Spectrophotometer in the wavelength range 200 nm to 1100 nm, the energy band gap, extinction coefficient and refractive index of the thin film were 2.5 eV , 0.024 and 2.51, respective