The lethality of inorganic arsenic (As) and the threat it poses have made the development of efficient As detection systems a vital necessity. This research work demonstrates a sensing layer made of hydrous ferric oxide (Fe2H2O4) to detect As(III) and As(V) ions in a surface plasmon resonance system. The sensor conceptualizes on the strength of Fe2H2O4 to absorb As ions and the interaction of plasmon resonance towards the changes occurring on the sensing layer. Detection sensitivity values for As(III) and As(V) were 1.083 °·ppb−1 and 0.922 °·ppb−1, respectively, while the limit of detection for both ions was 0.6 ppb. These findings support the feasibility and potential of the sensor configuration towards paving future advancement in As detection systems.
Zinc oxide thin films were deposited by chemical spray pyrolysis onto glass substrates which are held at a temperature of 673 K. Some structural, electrical, optical and gas sensing properties of films were studied. The resistance of ZnO thin film exhibits a change of magnitude as the ambient gas is cycled from air to oxygen and nitrogen dioxide
Nowadays, datacenters become more complicated and handle many more users’ requests. Custom protocols are becoming more demanded, and an advanced load balancer to distribute the requests among servers is essential to serve the users quickly and efficiently. P4 introduced a new way to manipulate all packet headers. Therefore, by making use of the P4 ability to decapsulate the transport layer header, a new algorithm of load balancing is proposed. The algorithm has three main parts. First, a TCP/UDP separation is used to separate the flows based on the network layer information about the used protocol in the transport layer. Second, a flow size prediction technique is adopted, which re
... Show MoreCadmium oxide (CdO) thin films were deposited using the sequencing ion layer adsorption and reaction (SILAR) method. In this study, the effect of the pH value of an aqueous solution of cadmium acetate at a concentration of 0.2 mol of the cadmium oxide film was determined. The solution source for the cadmium oxide film was cadmium ions and an aqueous ammonia solution. The CdO films were deposited on glass substrates at a temperature of 90 ℃. The cadmium oxide film thickness was determined by the weight difference method at pH values (7.2, 8.2). X-ray diffraction (XRD) and scanning electron microscopy (SEM) showed that the size of the crystals increased with the increase in the solution (pH). While the UV-visible spectra of the fil
... Show MoreIn this paper a refractive index sensor based on micro-structured optical fiber has been proposed using Finite Element Method (FEM). The designed fiber has a hexagonal cladding structure with six air holes rings running around its solid core. The air holes of fiber has been infiltrated with different liquids such as water , ethanol, methanol, and toluene then sensor characteristics like ; effective refractive index , confinement loss, beam profile of the fundamental mode, and sensor resolution are investigated by employing the FEM. This designed sensor characterized by its low confinement loss and high resolution so a small change in the analyte refractive index could be detect which is could be useful to detect the change of
... Show MoreMWCNTs-OH was used to prepare a flexible gas sensor by deposition as a network on a filter cake using the method of filtration from suspension (FFS). The morphological and structural properties of the MWCNTs network were characterized before and after exposure to Freon gas using FTIR spectra and X-ray diffractometer, which confirmed that the characteristics of the sensor did not change after exposure to the gas. The sensor was exposed to a pure Freon134a gas as well as to a mixture of Freon gas and air with different ratios at room temperature. The experiments showed that the sensor works at room temperature and the sensitivity values increased with increasing operating temperature, to be 58% unt
... Show MoreAbstract: Tin oxide thin films were deposited by direct current (DC) reactive sputtering at gas pressures of 0.015 mbar – 0.15 mbar. The crystalline structure and surface morphology of the prepared SnO2 films were introduced by X-ray diffraction (XRD) and atomic force microscopy (AFM). These films showed preferred orientation in the (110) plane. Due to AFM micrographs, the grain size increased non-uniformly as the working gas pressure increased.