The aim of the research is to shed light on identifying the extent of the university professor's competencies and their roles in managing and training participants in e-training workshops as a pedagogical point view. The research sample consisted of a group of (30) university professors (lecturers) in the training workshops, in scientific,humanitarian and social disciplines, including (12) a university professor (holding a trainer certificate), , the research methodology is descriptive, and the community is a group of trained participants. (115) participated in (40) e-training workshops organized by the Center for Continuing Education at the University of Baghdad (and the selection of workshops within the researcher's specialization in the field of information and knowledge technologies). And for the period (1/6/2020 - until 1/9/2021). Relying on the questionnaire tool, which includes two axes and (10) paragraphs, it was prepared for the participants to obtain their answers. And reach the most important results: 1. There are statistically significant differences in the possession of a university professor (a certified trainer) in the competencies in the use of training aids, programs and electronic applications compared to a university professor (as a lecturer) and in favor of a university professor (a certified trainer). 2. There are statistically significant differences in the university professor (accredited trainer) possessing the competencies in managing e-training workshops. This is due to his pedagogical personal formation as a university professor who is able to manage the classroom educationally, and a certified trainer who is able to manage the workshop electronically compared to the university professor (as a lecturer) and for the benefit of the professor University (Certified Trainer) The most important recommendation
: Porous silicon (n-PS) films can be prepared by photoelectochemical etching (PECE) Silicon chips n - types with 15 (mA /cm2), in15 minutes etching time on the fabrication nano-sized pore arrangement. By using X-ray diffraction measurement and atomic power microscopy characteristics (AFM), PS was investigated. It was also evaluated the crystallites size from (XRD) for the PS nanoscale. The atomic force microscopy confirmed the nano-metric size chemical fictionalization through the electrochemical etching that was shown on the PS surface chemical composition. The atomic power microscopy checks showed the roughness of the silicon surface. It is also notified (TiO2) preparation nano-particles that were prepared by pulse laser eradication in e
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