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Details
Publication Date
Fri Oct 01 2010
Journal Name
2010 Ieee Symposium On Industrial Electronics And Applications (isiea)
DOI
10.1109/isiea.2010.5679441
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UBbaCocBVTCNdQwC-jIW
Effectiveness of the cumulative vs. normal mode of operation for combinatorial testing
Mohammed I.
Kamal Z.
Rozmie R.
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