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Details
Publication Date
Fri Oct 01 2010
Journal Name
2010 Ieee Symposium On Industrial Electronics And Applications (isiea)
DOI
10.1109/isiea.2010.5679443
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Distributed t-way test suite data generation using exhaustive search method with map and reduce framework
Zainal Hisham Che
Syahrul Afzal Che
Kamal Zuhairi
Mohammed I.
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