Preferred Language
Articles
/
MRaiBocBVTCNdQwCITDb
T-Way Testing Strategies
...Show More Authors

In line with the advancement of hardware technology and increasing consumer demands for new functionalities and innovations, software applications grew tremendously in term of size over the last decade. This sudden increase in size has a profound impact as far as testing is concerned. Here, more and more unwanted interactions among software systems components, hardware, and operating system are to be expected, rendering increased possibility of faults. To address this issue, many useful interaction-based testing techniques (termed t-way strategies) have been developed in the literature. As an effort to promote awareness and encourage its usage, this chapter surveys the current state-of-the-art and reviews the state-of-practices in the field. In particular, unlike earlier work, this chapter also highlights the different possible adoptions of t-way strategies including uniform interaction, variable strength interaction, and input-output-based relation, that is, to help test engineers make informed decision on the actual use of t-way strategies.

Scopus Crossref
View Publication
Publication Date
Wed Jan 01 2014
Journal Name
Advances In Systems Analysis, Software Engineering, And High Performance Computing
T-Way Testing Strategies
...Show More Authors

In line with the advancement of hardware technology and increasing consumer demands for new functionalities and innovations, software applications grew tremendously in term of size over the last decade. This sudden increase in size has a profound impact as far as testing is concerned. Here, more and more unwanted interactions among software systems components, hardware, and operating system are to be expected, rendering increased possibility of faults. To address this issue, many useful interaction-based testing techniques (termed t-way strategies) have been developed in the literature. As an effort to promote awareness and encourage its usage, this chapter surveys the current state-of-the-art and reviews the state-of-practices in t

... Show More
View Publication
Scopus Crossref
Publication Date
Sat Jan 01 2011
Journal Name
Software Engineering And Computer Systems
Practical Adoptions of T-Way Strategies for Interaction Testing
...Show More Authors

View Publication
Scopus (7)
Crossref (2)
Scopus Crossref
Publication Date
Sat Jan 01 2011
Journal Name
International Journal Of Computer Theory And Engineering
MIPOG - An Efficient t-Way Minimization Strategy for Combinatorial Testing
...Show More Authors

View Publication
Crossref (16)
Crossref
Publication Date
Wed Oct 01 2008
Journal Name
2008 First International Conference On Distributed Framework And Applications
A strategy for Grid based t-way test data generation
...Show More Authors

View Publication
Scopus (22)
Crossref (16)
Scopus Crossref
Publication Date
Thu Oct 01 2009
Journal Name
2009 Ieee Symposium On Industrial Electronics & Applications
ITTW: T-way minimization strategy based on intersection of tuples
...Show More Authors

View Publication
Scopus (6)
Crossref (6)
Scopus Crossref
Publication Date
Fri Feb 05 2010
Journal Name
Etri Journal
MC-MIPOG: A Parallel t-Way Test Generation Strategy for Multicore Systems
...Show More Authors

View Publication
Scopus (42)
Crossref (27)
Scopus Clarivate Crossref
Publication Date
Thu Jun 01 2023
Journal Name
Iaes International Journal Of Artificial Intelligence (ij-ai)
Innovations in t-way test creation based on a hybrid hill climbing-greedy algorithm
...Show More Authors

<p>In combinatorial testing development, the fabrication of covering arrays is the key challenge by the multiple aspects that influence it. A wide range of combinatorial problems can be solved using metaheuristic and greedy techniques. Combining the greedy technique utilizing a metaheuristic search technique like hill climbing (HC), can produce feasible results for combinatorial tests. Methods based on metaheuristics are used to deal with tuples that may be left after redundancy using greedy strategies; then the result utilization is assured to be near-optimal using a metaheuristic algorithm. As a result, the use of both greedy and HC algorithms in a single test generation system is a good candidate if constructed correctly. T

... Show More
View Publication
Scopus (2)
Crossref (3)
Scopus Crossref
Publication Date
Mon May 11 2020
Journal Name
Baghdad Science Journal
DEO: A Dynamic Event Order Strategy for t-way Sequence Covering Array Test Data Generation
...Show More Authors

Sequence covering array (SCA) generation is an active research area in recent years. Unlike the sequence-less covering arrays (CA), the order of sequence varies in the test case generation process. This paper reviews the state-of-the-art of the SCA strategies, earlier works reported that finding a minimal size of a test suite is considered as an NP-Hard problem. In addition, most of the existing strategies for SCA generation have a high order of complexity due to the generation of all combinatorial interactions by adopting one-test-at-a-time fashion. Reducing the complexity by adopting one-parameter- at-a-time for SCA generation is a challenging process. In addition, this reduction facilitates the supporting for a higher strength of

... Show More
View Publication
Publication Date
Mon May 11 2020
Journal Name
Baghdad Science Journal
DEO: A Dynamic Event Order Strategy for t-way Sequence Covering Array Test Data Generation
...Show More Authors

Sequence covering array (SCA) generation is an active research area in recent years. Unlike the sequence-less covering arrays (CA), the order of sequence varies in the test case generation process. This paper reviews the state-of-the-art of the SCA strategies, earlier works reported that finding a minimal size of a test suite is considered as an NP-Hard problem. In addition, most of the existing strategies for SCA generation have a high order of complexity due to the generation of all combinatorial interactions by adopting one-test-at-a-time fashion. Reducing the complexity by adopting one-parameter- at-a-time for SCA generation is a challenging process. In addition, this reduction facilitates the supporting for a higher strength of cove

... Show More
View Publication Preview PDF
Scopus (8)
Crossref (5)
Scopus Clarivate Crossref
Publication Date
Fri Oct 01 2010
Journal Name
2010 Ieee Symposium On Industrial Electronics And Applications (isiea)
Distributed t-way test suite data generation using exhaustive search method with map and reduce framework
...Show More Authors

View Publication
Scopus (2)
Crossref (2)
Scopus Crossref